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BBIN·宝盈集团
AFM探针
高分辨率 AFM用于具有挑战性的前沿研究
筛选探针
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Spring Constant
<0.1N/m (30)
0.1-1N/m (75)
1.1-5N/m (46)
5.1-20N/m (9)
20.1-50N/m (73)
50.1-200N/m (7)
>200N/m (7)
Resonance Frequency
5KHz (1)
7KHz (12)
8KHz (1)
9KHz (1)
10KHz (5)
11KHz (2)
13KHz (10)
15KHz (12)
18KHz (17)
19KHz (1)
20KHz (5)
22KHz (13)
23KHz (13)
24KHz (2)
25KHz (0)
34KHz (2)
37KHz (1)
38KHz (12)
40KHz (10)
42KHz (1)
50KHz (1)
55KHz (4)
56KHz (13)
60KHz (3)
65KHz (15)
70KHz (12)
71KHz (3)
73KHz (2)
75KHz (23)
77KHz (1)
100KHz (2)
105KHz (1)
110KHz (3)
125KHz (12)
130KHz (3)
150KHz (8)
165KHz (1)
180KHz (2)
190KHz (11)
280KHz (1)
292KHz (13)
293KHz (3)
300KHz (13)
320KHz (31)
350KHz (4)
450KHz (2)
525KHz (5)
1400KHz (1)
Cantilever Length
16um (2)
27um (1)
30um (1)
36um (3)
38um (1)
42um (2)
60um (4)
70um (2)
75um (2)
85um (10)
97um (3)
100um (5)
110um (4)
115um (4)
117um (6)
120um (11)
123um (4)
125um (57)
130um (2)
140um (10)
150um (7)
160um (1)
170um (2)
175um (11)
197um (3)
200um (11)
205um (11)
210um (10)
215um (2)
225um (49)
230um (5)
240um (2)
300um (13)
305um (1)
310um (10)
350um (6)
397um (3)
400um (2)
450um (25)
465um (1)
Cantilever Geometry
Rectangular (173)
Rectangular & Triangular (12)
Special (22)
Triangular (26)
Cantilever Coating
40 ± 10nm of Al (1)
B: Drift Compensated Reflective Gold (1)
B: Proprietary reflective coating (3)
B: Reflective Al (1)
B: Reflective Aluminum (93)
B: Reflective Au (7)
B: Reflective CoCr (7)
B: Reflective Gold (31)
B: Reflective PtIr (5)
B: TiW/Au (500) (2)
F: Conductive Diamond (4)
F: Conductive Platinum (1)
F: Conductive PtIr (5)
F: Conductive PtSi (1)
F: Diamond-Like Carbon (2)
F: Gold (3)
F: Magnetic CoCr (8)
F: Wear resistant carbon (5)
Cantilever Material
0.01 - 0.02 Ωcm Antimony (n) doped Si (1)
0.01 - 0.02 Ωcm Silicon (3)
0.01 - 0.025 Ωcm Antimony (n) doped Si (119)
0.01 - 0.02Ωcm Antimony (n) doped Si (1)
0.010 - 0.025 Ωcm Silicon (14)
1 Ωcm Silicon (3)
Electrochemically Etched Wire (1)
Nickel (1)
Precision Cut Wire (1)
Silicon (9)
Silicon Nitride (51)
Single Crystal Diamond (4)
Solid Platinum (4)
Stainless Steel (7)
Tip Radius(Nom)
*1nm typical electrical resolution. (1)
<100nm (3)
<20nm (4)
<30nm (6)
<5nm (2)
10 ± 5nm (2)
100nm (4)
10nm (29)
15nm (6)
18nm (2)
1nm (5)
20nm (14)
25nm (7)
2nm (10)
30nm (8)
35nm (3)
40nm (8)
50 ± 10nm (2)
50nm (1)
5nm (9)
7nm (7)
80nm (1)
8nm (65)
Tip Geometry
Conical (5)
Critical Dimension (Overhang) (14)
High Aspect Ratio (19)
Pyramid (7)
Pyramidal (2)
Rotated (13)
Rotated (Symmetric) (85)
Solid Wire (14)
Standard (5)
Standard (Steep) (46)
Super Sharp (2)
Tipless (7)
Visible Apex (13)
Tip Coating
Amorphous Carbon (3)
Carbon Coated (2)
Conductive Diamond (4)
Conductive Platinum (1)
Conductive PtIr (1)
Conductive PtSi (1)
Diamond-Like Carbon (2)
gold (3)
Hand-crafted natural diamond Nanoindenting tip (7)
Highly conductive single crystal diamond (4)
Magnetic (8)
no tip coating (0)
Platinum/ Iridium (1)
PtIr (2)
TiW (2)
Tip Height
1.5-4.5um (2)
10-15um (110)
10-20um (13)
10um (3)
12.5±2.5um (4)
12.5um (2)
14-16um (3)
2-5um (1)
2.5-3.5um (4)
2.5-4.5um (2)
2.5-8.0um (28)
3-6um (6)
3-8um (9)
4-10um (4)
4.5-5.5um (2)
5-10um (1)
5-7um (1)
50um (7)
5um (1)
7-11um (1)
8-15um (1)
9-12um (2)
9-19um (3)
约100um (4)
Number Of Cantilevers
1个悬臂 (198)
2个悬臂 (5)
3个悬臂 (4)
4个悬臂 (13)
6个悬臂 (12)
Sample
Bio Molecules (46)
Cells (35)
Ceramics (128)
Data Storage (76)
Other Hard Samples (145)
Other Soft Sample (139)
Polymers (139)
Semiconductors (102)
Afm
BiosescopeResolve (14)
Data Storage (0)
DimensionFastScan (50)
DimensionIcon (185)
DimensionXR (180)
Innova (154)
Insight (62)
JPK (141)
MultiMode (150)
Non-Bruker (136)
Semiconductors (0)
Work Mode
AFM-nDMA (2)
CAFM (18)
contact (65)
contact resonance (3)
Critical Dimension (CD) AFM (15)
Deep Trench (DT) (8)
EFM (19)
Electrical Spectroscopy (15)
FAST SCAN (6)
Force spectroscopy (34)
HarmoniX (2)
KPFM (20)
LFM (8)
MFM (8)
Nanoindentation (11)
NanoScale TA (6)
PeakForce Deep Trench (3)
PeakForce QNM (25)
PeakForce QNM High-Accuracy (4)
peakforce tapping (63)
PeakForce TUNA (8)
PFM (19)
ScanAsyst (10)
SCM (13)
sMIM (2)
SSRM (10)
sthM (3)
STM (9)
tapping or non-contact (125)
TERS (2)
Torsional Resonance (TR) (13)
TUNA (14)
Application
Electrical (38)
Fluid Imaging (41)
General Topography (121)
Holes/ Trenches (42)
Mechanical Force Curves (70)
Mechanical Property Mapping (40)
nanoindenting/nanoscratching applications (1)
probe for calibration (2)
Pulling (35)
suitable for tip modification (8)
Ultra Hi-Res (17)
每页显示
9
15
30
50
条记录
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TESP-HAR
对比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 42N/m
Geometry
Rectangular
Tip Radius
10nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
TESP-SS
对比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 42N/m
Geometry
Rectangular
Tip Radius
2nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
TESP-SSW
对比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 42N/m
Geometry
Rectangular
Tip Radius
2nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
TESP-V2
对比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 37N/m
Geometry
Rectangular
Tip Radius
7nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
TESPA-HAR
对比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 42N/m
Geometry
Rectangular
Tip Radius
10nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
TESPA-V2
对比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 37N/m
Geometry
Rectangular
Tip Radius
7nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
TESPAW-V2
对比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 37N/m
Geometry
Rectangular
Tip Radius
7nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
TESPD
对比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 40N/m
Geometry
Rectangular
Tip Radius
18nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum,F: Diamond-Like Carbon
TESPDW
对比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 40N/m
Geometry
Rectangular
Tip Radius
18nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum,F: Diamond-Like Carbon
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探针对比
探针型号对比
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开始对比
最多4个
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